MRR 故障对二进制全光全加器的性能影响研究
DOI:
作者:
作者单位:

作者简介:

通讯作者:

中图分类号:

TH701 TN256 TP391. 72

基金项目:

国家自然科学基金(61861012)、广西自然科学基金联合资助培育项目(2018GXNSFAA138115)、广西自动检测技术与仪器重点实验室基金(YQ21106)项目资助


Performance impact of MRR fault to binary optical full adder
Author:
Affiliation:

Fund Project:

  • 摘要
  • |
  • 图/表
  • |
  • 访问统计
  • |
  • 参考文献
  • |
  • 相似文献
  • |
  • 引证文献
  • |
  • 资源附件
  • |
  • 文章评论
    摘要:

    针对现有的二进制全光全加器所需微环谐振器(MRR)数量较多的问题,首次提出了 3 个 MRR 串联结构的全光全加 器。 针对 MRR 对温度的波动和制程偏差非常敏感,容易产生故障,建立了 MRR 故障模型,设计了全光全加器(OFA)的可靠性 指标平均误差距离,分析了 MRR 单故障模型对 OFA 性能的影响。 插入损耗(insertion loss, IL)的实验结果表明,提出的 OFA 结 构总体上优于现有的 OFA 结构;相比现有的方案,提出的 OFA 结构的 MRR 硬件开销最多减少 70% ,最少减少 50% ;平均误差 距离的实验结果表明,方案 1 和方案 2 的平均误差距离较大,本文提出方案的平均误差距离适中;多位二进制全加器中,最高位 在单故障模型下的,平均误差距离的绝对值均随着多位二进制全加器的位数增加而增大;最低位在单故障模型下的,平均误差 距离的绝对值均随着多位二进制全加器的位数增加保持不变;实物验证和基于 Modelsim 平台的实验验证了 MRR 故障对全加 器的性能影响的正确性。

    Abstract:

    Aiming at the problem of large number of micro ring resonator (MRR) required by current all-optical full adder, an optical full adder with three Cascaded MRR structures is proposed for the first time. In view of the fact that MRR is sensitive to temperature fluctuation and process variation, the MRR fault model is established. The mean error distance of reliability metric ofoptical full adder (OFA) is designed, and the influence of MRR single fault model on OFA is analyzed. Simulation results of insertion loss show that the proposed OFA architecture is superior to existing OFA architecture in general. Compared with the current scheme, the hardware overhead of the proposed OFA architecture is reduced between 50% and 70% . Experimental results show that the average error distance of scheme 1 and scheme 2 is large, while the average error distance of the proposed scheme is moderate. For the multi-bit binary full adder, the absolute value of the average error distance increases with the number of bits of the multi-bit binary full adder in the single fault model with the highest bit. For the single fault model with the lowest bit, the absolute value of the average error distance remains unchanged with the number of bits of the multi bit binary full adder. Physical verification and experiments based on Modelsim platform verify the correctness of the effect of MRR fault on the performance of full adder.

    参考文献
    相似文献
    引证文献
引用本文

朱爱军,古展其,胡 聪,许川佩,李 智. MRR 故障对二进制全光全加器的性能影响研究[J].仪器仪表学报,2021,(7):164-176

复制
分享
文章指标
  • 点击次数:
  • 下载次数:
  • HTML阅读次数:
  • 引用次数:
历史
  • 收稿日期:
  • 最后修改日期:
  • 录用日期:
  • 在线发布日期: 2023-06-28
  • 出版日期: