Tang Shengxue
State Key Laboratory of Reliability and Intelligence of Electrical Equipment, School of Electrical Engineering, Hebei University of Technology, Tianjin 300401, ChinaTan Liqiang
State Key Laboratory of Reliability and Intelligence of Electrical Equipment, School of Electrical Engineering, Hebei University of Technology, Tianjin 300401, ChinaLi Conghong
Nanjing Vocational University of Industry Technology, Nanjing 210023, ChinaYan Jinjing
State Key Laboratory of Reliability and Intelligence of Electrical Equipment, School of Electrical Engineering, Hebei University of Technology, Tianjin 300401, ChinaMuhammad Ehtsham Akram
State Key Laboratory of Reliability and Intelligence of Electrical Equipment, School of Electrical Engineering, Hebei University of Technology, Tianjin 300401, ChinaZhao Jinze
State Key Laboratory of Reliability and Intelligence of Electrical Equipment, School of Electrical Engineering, Hebei University of Technology, Tianjin 300401, China1.State Key Laboratory of Reliability and Intelligence of Electrical Equipment, School of Electrical Engineering, Hebei University of Technology, Tianjin 300401, China; 2.Nanjing Vocational University of Industry Technology, Nanjing 210023, China
TM13;TN86