Wang Ziwei
College of Electronics and Information Engineering, Nanjing University of Information Science and Technology, Nanjing 210044, ChinaTao Xu
Jiangsu Integrated Circuit Reliability Technology and Testing System Engineering Research Center, Wuxi University, Wuxi 214105, ChinaLi Hui
1.College of Electronics and Information Engineering, Nanjing University of Information Science and Technology, Nanjing 210044, China;2.Jiangsu Integrated Circuit Reliability Technology and Testing System Engineering Research Center, Wuxi University, Wuxi 214105, China; 3.Graduate School of Chinese Aeronautical Establishment, Yangzhou 225006, ChinaShi Zhenting
College of Electronics and Information Engineering, Nanjing University of Information Science and Technology, Nanjing 210044, ChinaZhang Jian
Jiangsu Integrated Circuit Reliability Technology and Testing System Engineering Research Center, Wuxi University, Wuxi 214105, ChinaXu Yulong
College of Electronics and Information Engineering, Nanjing University of Information Science and Technology, Nanjing 210044, China1.College of Electronics and Information Engineering, Nanjing University of Information Science and Technology, Nanjing 210044, China;2.Jiangsu Integrated Circuit Reliability Technology and Testing System Engineering Research Center, Wuxi University, Wuxi 214105, China; 3.Graduate School of Chinese Aeronautical Establishment, Yangzhou 225006, China
TN915.81