Zhu Wangchun
School of Electronic Engineering and Automation, Guilin University of Electronic Technology, Guilin 541004, ChinaZhou Tian
School of Electronic Engineering and Automation, Guilin University of Electronic Technology, Guilin 541004, ChinaHu Cong
1. School of Electronic Engineering and Automation, Guilin University of Electronic Technology, Guilin 541004, China; 2. School of MechanoElectronic Engineering, Xidian University, Xi’an 710071, ChinaXu Chuanpei
School of Electronic Engineering and Automation, Guilin University of Electronic Technology, Guilin 541004, ChinaZhu Aijun
School of Electronic Engineering and Automation, Guilin University of Electronic Technology, Guilin 541004, China1. School of Electronic Engineering and Automation, Guilin University of Electronic Technology, Guilin 541004, China; 2. School of MechanoElectronic Engineering, Xidian University, Xi’an 710071, China
TN47
How to optimize the test time under multiple constraints is an urgent problem to be solved in the networkonchip (NoC) testing. An optimization method of NoC test scheduling based on sine cosine algorithm (SCA) is proposed. A parallel test method using dedicated test access mechanism (TAM) is adopted, and a test scheduling model for NoC is built to satisfy the power consumption and pin constraints. To achieve test time minimization, the population fluctuation with the sine and the cosine function around the optimal solution, and a group of random operators and adaptive variables are adopted. Comparing experiments on the ITC’02 test benchmarks test show that the proposed algorithm can achieve shorter test time than that of the particle swarm optimization (PSO) algorithm.
