As an important special light source, superluminescent diode ( SLD) has been proposed to evaluate the reliability of SLD performance degradation based on graphic methods in view of the high requirement of the reliability and lifetime prediction accuracy of SLD. First, the accelerated stress method is used to obtain the short-term failure-free data of the SLD. Secondly, according to the degradation trajectory, a curve equation suitable for the degradation trajectory is fitted by using the least square method, and the pseudo failure life of the SLD is calculated according to the failure threshold. Finally, Minitab was used to identify the individual distribution of the pseudo failure life, and a log-normal distribution with high acceptance was used to obtain the average working time before failure at room temperature. Experimental results show that this method can accurately predict the reliability and life of SLD, and its accuracy is improved by 9. 09% compared with other methods.