1.功率半导体封装与可靠性安徽省重点实验室(合肥工业大学)合肥230009; 2.合肥工业大学电气与自动化工程学院合肥230009
TP274; TN911.7
1.Anhui Province Key Laboratory of Semiconductor Packaging and Reliability (Hefei University of Technology), Hefei 230009, China; 2.School of Electrical Engineering and Automation, Hefei University of Technology, Hefei 230009, China
陈波,孙辉,储昭碧,李育玲,魏嘉乐.面向ECG彩虹码的双输入改进VIT识别研究[J].电子测量与仪器学报,2024,38(11):200-209
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