Guo Yaqi
1.Shanxi Key Laboratory of Signal Capturing and Processing, North University of China,Taiyuan 030051,China; 2.State Key Laboratory of Dynamic Testing Technology, North University of China,Taiyuan 030051,ChinaWang Jian
1.Shanxi Key Laboratory of Signal Capturing and Processing, North University of China,Taiyuan 030051,China; 2.State Key Laboratory of Dynamic Testing Technology, North University of China,Taiyuan 030051,ChinaHan Xingcheng
1.Shanxi Key Laboratory of Signal Capturing and Processing, North University of China,Taiyuan 030051,China; 2.State Key Laboratory of Dynamic Testing Technology, North University of China,Taiyuan 030051,ChinaHan Yan
1.Shanxi Key Laboratory of Signal Capturing and Processing, North University of China,Taiyuan 030051,China; 2.State Key Laboratory of Dynamic Testing Technology, North University of China,Taiyuan 030051,ChinaWang Zhongzheng
1.Shanxi Key Laboratory of Signal Capturing and Processing, North University of China,Taiyuan 030051,China; 2.State Key Laboratory of Dynamic Testing Technology, North University of China,Taiyuan 030051,China1.Shanxi Key Laboratory of Signal Capturing and Processing, North University of China,Taiyuan 030051,China; 2.State Key Laboratory of Dynamic Testing Technology, North University of China,Taiyuan 030051,China
TB566