Wu Chuanwei
Hanwei Electronics Group Corporation,Zhengzhou 450001, ChinaFang Yanqun
Hanwei Electronics Group Corporation,Zhengzhou 450001, ChinaChen Haiyong
1.Hanwei Electronics Group Corporation,Zhengzhou 450001, China; 2.School of Integrated Circuits, Huazhong University of Science and Technology,Wuhan 430074, ChinaGu Ruiqin
2.School of Integrated Circuits, Huazhong University of Science and Technology,Wuhan 430074, China; 3.Zhengzhou Winsen Electronics Technology Co., Ltd.,Zhengzhou 450001, ChinaLiu Huan
School of Integrated Circuits, Huazhong University of Science and Technology,Wuhan 430074, ChinaZhang Peng
Hanwei Electronics Group Corporation,Zhengzhou 450001, ChinaJia Lintao
Hanwei Electronics Group Corporation,Zhengzhou 450001, China1.Hanwei Electronics Group Corporation,Zhengzhou 450001, China; 2.School of Integrated Circuits, Huazhong University of Science and Technology,Wuhan 430074, China; 3.Zhengzhou Winsen Electronics Technology Co., Ltd.,Zhengzhou 450001, China
TB114.3