Wang Xu
1.School of Instrument and Electronics, North University of China, Taiyuan 030051, China; 2. Ceyear Technologies Co., Ltd, Qingdao 266555, ChinaNian Fushun
2. Ceyear Technologies Co., Ltd, Qingdao 266555, China; 3.Technology on Electronic Test & Measurement Laboratory, Qingdao 266555, ChinaDeng Jianqin
2. Ceyear Technologies Co., Ltd, Qingdao 266555, China; 3.Technology on Electronic Test & Measurement Laboratory, Qingdao 266555, ChinaWang Mo
2. Ceyear Technologies Co., Ltd, Qingdao 266555, China; 3.Technology on Electronic Test & Measurement Laboratory, Qingdao 266555, China1.School of Instrument and Electronics, North University of China, Taiyuan 030051, China; 2. Ceyear Technologies Co., Ltd, Qingdao 266555, China; 3.Technology on Electronic Test & Measurement Laboratory, Qingdao 266555, China
TM931