Li Zhangqian
1.State Key Laboratory of Electronic Testing Technology, North University of China, Taiyuan 030051; 2. Key Laboratory of Instrument Science and Dynamic Testing, Ministry of Education, Taiyuan 030051Zhang Ruihao
1.State Key Laboratory of Electronic Testing Technology, North University of China, Taiyuan 030051; 2. Key Laboratory of Instrument Science and Dynamic Testing, Ministry of Education, Taiyuan 030051Ma Yinhong
1.State Key Laboratory of Electronic Testing Technology, North University of China, Taiyuan 030051; 2. Key Laboratory of Instrument Science and Dynamic Testing, Ministry of Education, Taiyuan 030051Hong Yingping
1.State Key Laboratory of Electronic Testing Technology, North University of China, Taiyuan 030051; 2. Key Laboratory of Instrument Science and Dynamic Testing, Ministry of Education, Taiyuan 030051Zhang Huixin
1.State Key Laboratory of Electronic Testing Technology, North University of China, Taiyuan 030051; 2. Key Laboratory of Instrument Science and Dynamic Testing, Ministry of Education, Taiyuan 0300511.State Key Laboratory of Electronic Testing Technology, North University of China, Taiyuan 030051; 2. Key Laboratory of Instrument Science and Dynamic Testing, Ministry of Education, Taiyuan 030051
TN919
