Xu Jun
1.Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051,China; 2.School of Instrument and Electronics, North University of China, Taiyuan 030051,ChinaJin Chen
1.Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051,China; 2.School of Instrument and Electronics, North University of China, Taiyuan 030051,ChinaWang Xudong
1.Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051,China; 2.School of Instrument and Electronics, North University of China, Taiyuan 030051,ChinaQin Li
1.Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051,China; 2.School of Instrument and Electronics, North University of China, Taiyuan 030051,ChinaWen Huanfei
1.Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051,China; 2.School of Instrument and Electronics, North University of China, Taiyuan 030051,ChinaMa Zongmin
1.Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051,China; 2.School of Instrument and Electronics, North University of China, Taiyuan 030051,China1.Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051,China; 2.School of Instrument and Electronics, North University of China, Taiyuan 030051,China
TH741
