The Design, Test and Analysis of a SRAM PUF Chip Based on BCH Algorithm
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1.School of Nano Technology and Nano Bionics,University of Science and Technology of China, Hefei 230026, China; 2. Suzhou Institute of Nano-Tech and Nano-Bionics,Chinede Academy of Science ,Suzhou 215123,China

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TN432

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    Abstract:

    PUF(physically unclonable functions,PUF) is a new type of information security hardware,which has been widely used in the fields of Internet of things, consumer electronics and so on.SRAM based PUF is one of the most widely used types in industry.The SRAM PUF, based on Huahong 0.11μm CMOS process, solves the error rate problem caused by SRAM instability by introducing a BCH algorithm.Through the design of MCU test circuit and PUF chip test board, the key indexes such as in-chip hamming distance, inter-chip hamming distance and stability of PUF chip are tested and analyzed in detail.According to the test results, the hamming distance between the PUF films is 42.2% and the hamming distance within the films is 20.0%. When the error correction mechanism of the BCH algorithm is running, the hamming distance in the chip is reduced to 0, which solves the error rate problem in the process of PUF implementation. This study shows that the problem of instability can be solved by combining BCH algorithm with SRAM unit. The PUF chip combined with BCH algorithm and SRAM unit can meet the needs of recognition, electronic label and other applications.

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  • Online: October 18,2024
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