Standardization research of STDF based on the automatic test equipment
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Beijing Key Laboratory of Integrated Circuit Testing Technology, Beijing Institute of Automatic Test Technology, Beijing 100088, China

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TN302

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    Abstract:

    Because of the test data is not unified, the test efficiency of the ATE is low and the cost is wasted. In order to overcome this problem, we analyzed the processing methods of each STDF file module and designed a conversion program using LabWindows/CVI software environment for Specification of STDF files, which is the test data standard format for ATE. By this algorithm, the bidirectional conversion between binary file STDF and text file is completed. By comparing the generated text and standard ATD text, the correctness of the program transformation is verified. In the end, the conversion program is embedded in the domestic BC3192V50 ATE, it realized the uniform of the test data. The result of the test shows that this algorithm can efficiently achieve bidirectional conversion, the structure of the test data is regulated and the analysis ability of the test data is improved.

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  • Received:
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  • Online: July 19,2017
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