Hou Xingna
School of Electronic Engineering and Automation, Guilin University of Electronic Technology, Guilin 541004, China; Guangxi Key Laboratory of Automatic Detecting Techno1ogy and Instruments, Guilin 541004, ChinaChen Shouhong
School of Electronic Engineering and Automation, Guilin University of Electronic Technology, Guilin 541004, China; Guangxi Key Laboratory of Automatic Detecting Techno1ogy and Instruments, Guilin 541004, ChinaMa Jun
School of Electronic Engineering and Automation, Guilin University of Electronic Technology, Guilin 541004, China; Guangxi Key Laboratory of Automatic Detecting Techno1ogy and Instruments, Guilin 541004, ChinaHe Zhengliang
School of Electronic Engineering and Automation, Guilin University of Electronic Technology, Guilin 541004, China; Guangxi Key Laboratory of Automatic Detecting Techno1ogy and Instruments, Guilin 541004, ChinaSchool of Electronic Engineering and Automation, Guilin University of Electronic Technology, Guilin 541004, China; Guangxi Key Laboratory of Automatic Detecting Techno1ogy and Instruments, Guilin 541004, China
TN407