As it was difficult in the radiation effect induced by the high energy particle incident semiconductor materials, the ground radiation test was studied from the experimental platform.Based on the analysis of the single-event effect, the evaluating method is presented. Mainly consisted of data acquisition system and data analysis system,he experimental platform investigated the effects of four SRAM FPGA chips on single particles under different radiation sources and different intensities.Through the radiation test, the validity and reliability of the test method and test system are verified, and the processing method of test data is mastered.The experimental results show that the high strength, under the irradiation of single particle flip effect significantly increased, need to take protective measures in a timely manner, the use of FPGA chip and selection has reference value.