CID-YOLO:改进的YOLOv11 PCB缺陷检测算法
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南京师范大学电气与自动化工程学院 南京 210023

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TP391.4;TN791

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CID-YOLO: Improved YOLOv11 PCB defect detection algorithm
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School of Electrical and Automation Engineering,Nanjing Normal University, Nanjing 210023, China

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    摘要:

    针对印刷电路板(PCB)表面缺陷检测网络存在对小缺陷敏感性低、检测效率低下等难题。提出了一种基于YOLOv11改进的PCB缺陷检测算法CID-YOLO。首先,结合IDWC(inception depthwise convolution)改进C3k2模块,通过多分支特征提取机制,减少因网络深度增加而造成PCB表面缺陷高位特征信息的丢失,并减少模型参数量;其次,引入动态激活机制Dynamic Tanh改进C2PSA模块,增强模型非线性表达能力,使模型能更好地适应不同尺度的缺陷特征;接着嵌入CGBD下采样模块通过高效的上下文信息提取机制,提高PCB表面特殊缺陷的识别能力;最后,替换原分类损失函数,通过动态加权策略抑制数据不均衡导致的梯度偏移,有效提升模型泛化性能。实验结果表明,提出的CID-YOLO模型在北京大学公共PCB缺陷数据集上的平均精度均值(mAP)mAP50和mAP50.95指标分别达到96.0%和52.7%,较基线模型分别提升2.4%和1.6%,证明了所提算法的有效性。

    Abstract:

    To address the issues in printed circuit board(PCB)surface defect detection networks, such as low sensitivity to small defects and low detection efficiency, a PCB defect detection algorithm CID-YOLO based on the improved YOLOv11 is proposed. First, the C3k2 module is improved by integrating Inception Depthwise Convolution, which, through a multi-branch feature extraction mechanism, reduces the loss of high-level feature information of PCB surface defects caused by increased network depth and decreases the number of model parameters. Second, a dynamic activation mechanism, Dynamic Tanh, is introduced to improve the C2PSA module, enhancing the model′s nonlinear representation capability, allowing it to better adapt to defect features of different scales. Next, the CGBD downsampling module is embedded to improve the recognition capability for special PCB surface defects through an efficient context information extraction mechanism. Finally, the original classification loss function is replaced, and a dynamic weighting strategy is applied to suppress gradient bias caused by data imbalance, effectively improving model generalization performance. Experimental results show that the proposed CID-YOLO model achieves mAP50 and mAP50.95 scores of 96.0% and 52.7%, respectively, on the Peking University public PCB defect dataset, improving 2.4% and 1.6% compared to the baseline model, demonstrating the effectiveness of the proposed algorithm.

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钟长彬,施建平,祝孟洋,杨宏凯. CID-YOLO:改进的YOLOv11 PCB缺陷检测算法[J].电子测量技术,2026,49(13):181-189

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  • 在线发布日期: 2026-09-08
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